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Seminar Content
The History and Strategy of SPC
Basic Graphical Methods
Quality Control versus Process Control
The Central Limit Theorem
Introduction to Non-normal Data
Monitoring Process Behavior
Sources of Variation
Common and Special Cause Sources
Detecting Special Cause Sources
Sampling
Random, Systematic and Rational Samples
Appropriate Sample Size
Xbar and R Charts
Differences Between Measurements and Averages
Computing Control Limits and Charting
Chart Interpretation
X and MR Charts
p, c, np, and u Charts
Guidelines for Analysis of Charts
Process Capability
The Standard Normal Capability Indices: Cpk and Cp; Ppk and Pp |
Complimentary breakfast and lunch included.
Each participant will receive a comprehensive manual at the start of the seminar and upon successful completion, participants will receive certification. |
